(a) Diagrammatic representation of NanoSIMS ion optics of cameca NanoSIMS 50 L (b) the illustration portray a typical dynamic SIMS apparatus, wherein energetic ions emitted from an ion gun (1 or 2) are targeted onto the sample (3), induces ionization and removal of surface atoms through sputtering (4). Subsequently, the secondary ions are collected by ion lenses (5) filtered based on atomic mass by mass analyzer (6), and directed towards an electron multiplier (7, upper part), a faraday cup (7, lower part), or a CCD screen (8), then generates information as 2 or 3-dimensional images, depicting the arrangement of distinct sample elements [26, 27].